Development of test software and hardware for testing electronic assemblies in electronics manufacturing
A.T.i. Software GmbH
Landsberger Str. 394, 81241 MünchenNew on Amplifa
About A.T.i. Software
A.T.i. Software GmbH was founded in 1987 as an engineering office in Munich and has specialized in test software and hardware for the electrical testing of electronic assemblies for over 35 years. The company develops customized software and hardware solutions for In-Circuit Test (ICT), Boundary Scan Test (BST), Active Scan Test (AST), Functional Test (FKT) and In-System Programming (ISP). The range of services includes consulting, creation of test concepts, design of test fixtures (adapters), delivery, commissioning and support at the customer's site – including training, debugging support and traceability solutions with database connectivity. The core competence is parallel In-System Programming on the ICT test adapter, in which up to 128 identical devices can be programmed simultaneously depending on the interface; more than 100 models have already been implemented, including ATMEGAx, PICx, MSPxx and STMx. The turnkey ATE solutions are based on Teradyne test systems, while in-house systems are used for programming and debugging the test programs. Since 2002, A.T.i. has been a Selected Member of the TSN network, and since 2016 it has been certified to ISO 9001. From its Munich location, the company supports electronics manufacturing throughout Germany.
- Site
- München
- Processes
- In-Circuit Test (ICT), Boundary Scan Test (BST) according to IEEE 1149.1, Active Scan Test (AST), Functional Test (FKT), In-System Programming (ISP), parallel in banks up to 64 bits wide, Consulting / creation of test concepts / design of test fixtures (adapters) / commissioning, Turnkey ATE solutions (test systems) for electronics manufacturing, Training courses / support (telephone and on-site) / debugging support
- Materials
- Electronic assemblies (circuit boards/PCB), Microcontroller ATMEGAx, Microcontroller PICx, Microcontroller MSPxx, Microcontroller STMx, MC9S08AW32, MC9S12XEG128, R5F10AGF
- Certificates
- ISO 9001
- Founded
- 1987
- Industries
- Electronics manufacturing, Electronics industry
- 01
Consulting
- 02
Creation of test concept
- 03
Design of test fixtures (adapters)
- 04
Programming and debugging of test software
- 05
Delivery
- 06
Commissioning
- 07
Support and training
Test Methods and Platforms
In-Circuit Test (ICT)
Test method for analog components and complex digital components with short test times and high test coverage.
Boundary Scan Test (BST) according to IEEE 1149.1
Testing of electronic assemblies via the JTAG port even with reduced access to the circuit board.
Active Scan Test (AST)
Component test for microcontrollers without internal BST logic.
In-System Programming (ISP)
Parallel programming of microcontrollers, EEPROM and Flash in banks up to 64 bits wide directly on the ICT test adapter.
Functional Test (FKT)
Testing of assemblies for compliance with the parameters specified by development.
Location
München
DEHeadquarters, development and test house
- Materials
- Electronic assemblies (PCB), microcontrollers incl. ATMEGAx, PICx, MSPxx, STMx
- Teradyne Inline Test System TSI5/x
- Teradyne Inline Test System TSH
- Test Station LH12x
- Test Station SE (Spectrum 88xx)
- Teradyne Test System GR228x
- Teradyne Test System TS-LH1xx
- Teradyne Test System TS1xx
- Teradyne Test System TS-TSR
- Teradyne Test System TS-DUO
- In-house proprietary test systems
Industries
Processes & technical limits
| Processes | Tolerance | Max. part | Weight | Lot size | Materials |
|---|---|---|---|---|---|
| In-Circuit Test (ICT)Testing | – | – | – | – | Electronic assemblies (PCB), analog components (resistors, capacitors, inductors), digital components |
| Boundary Scan Test (BST) according to IEEE 1149.1Testing | – | – | – | – | Electronic assemblies, digital devices with JTAG port |
| Active Scan Test (AST)Testing | – | – | – | – | Microcontrollers without internal BST logic |
| Functional Test (FKT)Testing | – | – | – | – | Electronic assemblies |
| In-System Programming (ISP), parallel in banks up to 64 bits wideTesting | – | – | – | – | Microcontrollers (ATMEGAx, PICx, MSPxx, STMx and others), EEPROM, Flash, uP/uC devices |
| Consulting / creation of test concepts / design of test fixtures (adapters) / commissioningEngineering | – | – | – | – | – |
| Turnkey ATE solutions (test systems) for electronics manufacturingTesting | – | – | – | – | Electronic assemblies |
| Training courses / support (telephone and on-site) / debugging supportEngineering | – | – | – | – | – |
10 Anlagen & Maschinen
| Machine | Manufacturer / model | Quantity | Working area | Year built | Site |
|---|---|---|---|---|---|
| Teradyne Inline Test System TSI5/x | Teradyne TSI5/x | – | – | – | München |
| Teradyne Inline Test System TSH | Teradyne TSH | – | – | – | München |
| Test Station LH12x | Teradyne LH12x | – | – | – | München |
| Test Station SE (Spectrum 88xx) | Teradyne SE / Spectrum 88xx | – | – | – | München |
| Teradyne Test System GR228x | Teradyne GR228x | – | – | – | München |
| Teradyne Test System TS-LH1xx | Teradyne TS-LH1xx | – | – | – | München |
| Teradyne Test System TS1xx | Teradyne TS1xx | – | – | – | München |
| Teradyne Test System TS-TSR | Teradyne TS-TSR | – | – | – | München |
| Teradyne Test System TS-DUO | Teradyne TS-DUO | – | – | – | München |
| In-house proprietary test systems (programming/debugging) | – | – | – | – | München |
Additional services
Quality
A.T.i. Software GmbH has been certified to ISO 9001 since 2016; the last audit took place in 2025. Customers rate the company in the areas of quality, adherence to delivery dates and customer service with a grade of 1.18 (very good).
| Evidence | München |
|---|---|
| ISO 9001 |
Company History
- 1987
Founded as an engineering office in Munich
- 2002
Selected Member of the TSN network
- 2016
Initial ISO 9001 certification
- 2025
Most recent ISO 9001 audit