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AdMOS – Fertigung

AdMOS develops measurement systems, a semiconductor measurement lab, SPICE models and software for semiconductor and electronics development.

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AdMOS GmbH

Frickenhausen (headquarters with own semiconductor measurement lab)New on Amplifa

1997Founded by Dr. Thomas Gneiting
2007Occupancy of the company building with own measurement lab
1Location (headquarters Frickenhausen)
-60 bis +205 °CTemperature range of characterization
0,1 Hz – 10 MHzFrequency range of the 3002A Flicker-Noise measurement

About AdMOS

AdMOS GmbH (Advanced Modeling Solutions) was founded in 1997 by Dr. Thomas Gneiting and is a specialized technology company for semiconductor and electronics development. For over 25 years, AdMOS has combined semiconductor expertise with practical engineering work: the company supports customers in semiconductor and electronics development with reliable measurement data, dependable models and technical evaluation of demanding devices, designs and interconnect systems. In the company's own semiconductor measurement lab in Frickenhausen, electrical characterizations are performed at wafer and board level, including DC and CV measurements, low-frequency-noise and 4-port S-parameter measurements as well as temperature characterization in the range from -60 °C to +205 °C. A particular area of expertise is 1/f noise characterization, for which AdMOS has developed its own measurement system (3002A Flicker-Noise-Measurement System). In addition, the company offers customer-specific SPICE models and device libraries for modern semiconductor technologies (CMOS, RF-CMOS, FinFET, GaN, InP), simulation-based design analysis (signal integrity, thermal, EMC) as well as technical software development. AdMOS has been involved for many years in national and European research projects in semiconductor, RF and quantum technology, among other things with cryogenic SPICE models for quantum systems.

Site
Frickenhausen
Processes
Flicker-noise measurement / 1/f noise and low-frequency noise characterization, SPICE and CMOS modeling (customer-specific SPICE models and device libraries), DC and CV measurements on semiconductor devices (wafer and board level), Low-frequency-noise measurement and noise modeling, 4-port S-parameter measurements (RF analyses at wafer and board level), Temperature characterization (-60 ℃ to +205 ℃), Software development for measurement, analysis and modeling, Design analysis (signal integrity, thermal, EMC; passive components at PCB and chip level)
Materials
CMOS, RF-CMOS, FinFET, GaN, InP, Silicon (ultra-thin silicon chips)
Certificates
ISO 9001
Founded
1997
Industries
Semiconductor industry, Electronics development, RF engineering, Quantum technology, Automotive electronics (HV interconnects), Photonics
  1. 01

    Electrical measurement (DC/CV, noise, S-parameters) at wafer and board level

  2. 02

    Parameter extraction and measurement data evaluation

  3. 03

    SPICE modeling and creation of device libraries

  4. 04

    Simulation-based design analysis (signal integrity, thermal, EMC)

  5. 05

    Software development and system integration

  6. 06

    Documentation and report for the customer

Technologies and Materials

CMOS

CMOS

Modeling and characterization of CMOS transistors, also cryogenic for quantum technology

RF-CMOS

RF-CMOS

Modeling of RF effects based on S-parameters, noise and nonlinear behavior

FinFET

FinFET

Measurement-data-based SPICE models for modern FinFET technologies

GaN

GaN

Modeling of high-voltage, power and GaN devices

InP

InP

SPICE models for InP-based RF devices for 6G, photonics and AI applications

Si

Silicon (ultra-thin silicon chips)

Modeling and simulation of flexible microsystems with ultra-thin silicon chips

Locations

Standort Frickenhausen

Frickenhausen

DE

Headquarters with own semiconductor measurement lab

Materials
CMOS, RF-CMOS, FinFET, GaN, InP
  • AdMOS 3002A Flicker-Noise-Measurement System (3012 Filter Unit + 3023 Control Unit)
  • Suess PA200 semi-automatic probe station (wafers up to 200 mm)
  • Cascade Microtech PA300 semi-automatic probe station (wafers up to 300 mm)
  • Board-level test bench (manual)

Products and Services

3002A Flicker-Noise-Measurement System
3002A Flicker-Noise-Measurement SystemOwn measurement system · 1/f noise
SPICE device libraries and models
SPICE device libraries and modelsCMOS/FinFET/GaN modeling · semiconductor industry
Wafer-level characterization
Wafer-level characterizationMeasurement lab · semiconductor industry

Inside the production

Semiconductor measurement lab in Frickenhausen
Semiconductor measurement lab in Frickenhausen
Company building Frickenhausen (since 2007)
Company building Frickenhausen (since 2007)

Industries

Semiconductor industryElectronics developmentRF engineeringQuantum technologyAutomotive electronics (HV interconnects)PhotonicsResearch institutions

Processes & technical limits

ProcessesToleranceMax. partWeightLot sizeMaterials
Flicker-noise measurement / 1/f noise and low-frequency noise characterizationTesting––––Semiconductor devices
SPICE and CMOS modeling (customer-specific SPICE models and device libraries)Engineering––––CMOS, RF-CMOS, FinFET, GaN, InP
DC and CV measurements on semiconductor devices (wafer and board level)Testing––––Semiconductor devices
Low-frequency-noise measurement and noise modelingTesting––––Semiconductor devices
4-port S-parameter measurements (RF analyses at wafer and board level)Testing––––Semiconductor devices
Temperature characterization (-60 ℃ to +205 ℃)Testing––––Semiconductor devices
Software development for measurement, analysis and modelingEngineering–––––
Design analysis (signal integrity, thermal, EMC; passive components at PCB and chip level)Engineering–––––
Simulation and consulting for HV and high-speed connectorsEngineering–––––

4 Anlagen & Maschinen

MachineManufacturer / modelQuantityWorking areaYear builtSite
Flicker-Noise-Measurement System (3012 Filter Unit + 3023 Control Unit)AdMOS 3002A–Frequency range 0.1 Hz to 10 MHz, DC bias ±50V / ±100mA–Frickenhausen
Semi-automatic probe station (wafer prober)Suess PA200–Wafers up to 200 mm–Frickenhausen
Semi-automatic probe station (wafer prober)Cascade Microtech PA300–Wafers up to 300 mm–Frickenhausen
Board-level test bench (manual)––––Frickenhausen

Additional services

Flicker-noise / 1/f noise measurement system (3002A)SPICE and CMOS modeling, device librariesSemiconductor measurement lab (DC/CV, low-frequency noise, 4-port S-parameters)Software development for measurement, analysis and parameter extractionDesign analysis (signal integrity, thermal, EMC)Evaluation of HV and high-speed connectorsTraining and system integrationCryogenic SPICE models for quantum technology

Quality

AdMOS works with structured development processes, code reviews, unit tests, integration tests and regression tests in software development. Electrical characterization is carried out with reproducible measurements at wafer and board level in the company's own measurement lab.

EvidenceFrickenhausen
ISO 9001

History

  1. 1997

    Founding of AdMOS by Dr. Thomas Gneiting based on his dissertation

  2. 2007

    Occupancy of the company building in Frickenhausen with its own measurement lab and specially equipped development workstations

  3. 2025

    AdMOS becomes part of SpringPeak Ventures GmbH; management team expanded

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