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Andanta – Fertigung

Development and hybridization of optoelectronic InGaAs and silicon image sensors for scientific applications

Andanta Logo

ANDANTA GmbH Detektortechnologie

OlchingNew on Amplifa

2009Founded (January)
HRB 177252, Amtsgericht MünchenCommercial Register
Stifterstraße 5R, 82140 OlchingLocation
Flip chip 200 µm–60 mm, Target chip 500Chip sizes flip-chip bonding

About Andanta

ANDANTA GmbH was founded in January 2009 and specializes in the development and provision of optoelectronic image sensors and detector arrays. The product range includes InGaAs array detectors (FPAs) and linear detectors (LDAs) for the near-infrared range (0.9–2.2 µm), high-resolution Si CCD sensors for UV to near-infrared, custom Si TDI sensors, X-ray CCDs, and curved image sensors. In addition to standard products, an increasing number of custom special developments are being created in close collaboration with manufacturing partners. The company also offers a flip-chip bonding service for the hybridization of photodiode arrays with Si-CMOS readout circuits as well as an image sensor test laboratory. Customers include camera developers and manufacturers as well as manufacturers of spectrometers, telescopes, and scientific optoelectronic systems. The company is headquartered in Olching near Munich.

Site
Olching
Processes
Flip-Chip Bonding Service (hybridization of photodiode array with Si-CMOS readout circuit), Si-CMOS readout circuit assembly / image sensor assembly, Flip-Chip Bonding Service, Image Sensor Test Laboratory, Consulting on detector solutions, Application-specific custom developments with manufacturing partners
Materials
Indium Gallium Arsenide (InGaAs), Silicon, Kovar, Indium Gallium Arsenide
Certificates
Image Sensor Test Laboratory
Founded
2009
Industries
Camera development and manufacturing, Spectrometers, Telescopes, Scientific optoelectronic systems, NIR spectroscopy, Interferometry
  1. 01

    Consulting on detector solutions

  2. 02

    Custom development with manufacturing partners

  3. 03

    Flip-chip bonding (hybridization)

  4. 04

    Sensor assembly

  5. 05

    Testing in the image sensor test laboratory

  6. 06

    Sales

Materials and Semiconductor Technologies

InGaAs

Indium Gallium Arsenide

Semiconductor material for NIR image sensors in the spectral range 0.9 (0.6) µm to 1.7 (2.2) µm.

Si

Silicon

Material for CCD, CMOS and TDI image sensors for UV to near infrared (300–1100 nm).

Kovar

Package material for cooled InGaAs array and linear sensors.

Site

Olching

DE

Headquarters

Materials
InGaAs, silicon, Kovar
  • Image sensor test laboratory

Products and Devices

InGaAs Array Detector (FPA)
InGaAs Array Detector (FPA)NIR imaging · Spectroscopy and material analysis
InGaAs Linear Detector (LDA)
InGaAs Linear Detector (LDA)NIR line sensor · NIR spectroscopy and strip material inspection
Si CCD Sensor
Si CCD SensorSilicon image sensor · UV to near infrared
Si TDI Image Sensor
Si TDI Image SensorTime Delay Integration · Custom special development
X-ray Si CCD
X-ray Si CCDCCD · Direct X-ray detection
Curved Si CCD
Curved Si CCDConcave/convex image sensors · Custom
Flip-Chip Bonding
Flip-Chip BondingHybridization · Photodiode array with Si-CMOS ROIC

Inside the production

Logo Andanta GmbH
Logo Andanta GmbH
Flip-Chip Bonding
Flip-Chip Bonding
Flip-Chip Bonding Detail
Flip-Chip Bonding Detail
Company Presentation
Company Presentation

Industries

Camera development and manufacturingSpectrometersTelescopesScientific optoelectronic systemsNIR spectroscopyInterferometryStrip material inspectionHyper- and multispectral material analysis and sorting

Processes & technical limits

ProcessesToleranceMax. partWeightLot sizeMaterials
Flip-Chip Bonding Service (hybridization of photodiode array with Si-CMOS readout circuit)Assembly–60 mm (flip chip) / 150 mm (target chip)––InGaAs, silicon (Si-CMOS)
Si-CMOS readout circuit assembly / image sensor assemblyAssembly––––silicon

Additional services

Flip-Chip Bonding ServiceImage Sensor Test LaboratoryConsulting on detector solutionsApplication-specific custom developments with manufacturing partners

Quality and Testing

An in-house image sensor test laboratory is available for the characterization and testing of the sensor assemblies; hybridization is carried out using the flip-chip process without wire bonds.

EvidenceOlching
Image Sensor Test Laboratory

Company History

  1. 2009

    Foundation of ANDANTA GmbH in January; specialization in the development and provision of high-quality optoelectronic image sensors and detector arrays.

  2. 2021

    News from Vision 2021: VIS InGaAs array sensors (QVGA/VGA), 64x64 InGaAs array sensors, 4k Si TDI CCD, InGaAs APD/PIN/4-quadrant photodiodes.

  3. 2022

    News from Vision 2022: Linear InGaAs sensors, 1.9 µm InGaAs arrays extended into the infrared, flip-chip bonding service.

  4. 2024

    News from Vision 2024: 1280x1024 InGaAs array sensor, 2048x1 InGaAs linear sensor, price reduction for 640x512 InGaAs array sensors (Badger).

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