Development and production of electronic test systems for in-circuit, functional and semiconductor testing
Dr. Eschke Elektronik GmbH
Berlin · Waldshut-TiengenNew on Amplifa
About Dr. Eschke Elektronik
Dr. Eschke Elektronik GmbH develops and produces electronic test systems for the manufacturing, development and servicing of electronic assemblies. The portfolio includes in-circuit testers, functional testers, component testers, inline testers, semiconductor testers as well as boundary scan and AOI test solutions; various methods can be combined in a compact tester. The freely scalable CT3xx tester family with a uniform bus system, CTestAdvisor operating software, CAD and test data import, test coverage analysis and server-based repair data management enables customized turnkey test engineering solutions. More than 750 test systems are in use internationally, including in electronics manufacturing, the automotive industry, railway safety technology, semiconductor and telecommunications technology, and optoelectronics. The company was founded in 1990 and is headquartered in Berlin; a branch for sales, support and service exists in Waldshut-Tiengen.
- Site
- Berlin
- Processes
- In-Circuit Test, Functional Test, Component Test, Semiconductor Test, Boundary Scan Test, AOI Test, Inline Test, High Speed Mixed Signal Test (digital up to 6 GS/s, analog up to 5 GS/s)
- Materials
- Populated circuit boards (PCB), Semiconductor devices, In-Circuit Test, Functional Test, Semiconductor/Component Test, Boundary Scan Test, AOI Test, High Speed Mixed Signal Test
- Certificates
- Customer-origin QMS integration
- Founded
- 1990
- Industries
- Electronics manufacturing, Automotive, Railway safety technology, Semiconductors, Telecommunications/transmission technology, Optoelectronics
- 01
Hardware and software development
- 02
Production of the test systems
- 03
Sales
- 04
Support and service
Test Methods & Measurement Technology
In-Circuit Test
Testing of populated PCBs for assembly and connection defects.
Functional Test
Fully dynamic test of the function of electronic assemblies.
Semiconductor/Component Test
Testing of semiconductor devices and electronic components.
Boundary Scan Test
Boundary scan test for digital networks, including Göpel BST integration.
AOI Test
Automated optical inspection as a test function in the compact tester.
High Speed Mixed Signal Test
Sampling rates of up to 6 GS/s digital and 5 GS/s analog.
Locations
Berlin
DEHeadquarter: development, production, sales and support
- Materials
- High Speed Mixed Signal, digital/analog
- CT350 Comet T EH
- CT350 Comet C
- CT300 Galaxy/Meteor/Satellite
- CT300 Basic System
- CT250/CT250M
- DAT500
- DAT100-CD
- DM1G
- AM30-4B
- CDM24
- Repair Station
Test Systems
Inside the production
Industries
Processes & technical limits
| Processes | Tolerance | Max. part | Weight | Lot size | Materials |
|---|---|---|---|---|---|
| In-Circuit TestTesting | – | – | – | – | Electronics/PCBs |
| Functional TestTesting | – | – | – | – | Electronics/PCBs |
| Component TestTesting | – | – | – | – | Electronic components |
| Semiconductor TestTesting | – | – | – | – | Semiconductors |
| Boundary Scan TestTesting | – | – | – | – | Electronics/PCBs |
| AOI TestTesting | – | – | – | – | Electronics/PCBs |
| Inline TestTesting | – | – | – | – | Electronics/PCBs |
| High Speed Mixed Signal Test (digital up to 6 GS/s, analog up to 5 GS/s)Testing | – | – | – | – | Electronics |
20 Anlagen & Maschinen
| Machine | Manufacturer / model | Quantity | Working area | Year built | Site |
|---|---|---|---|---|---|
| Combination test system | Dr. Eschke Elektronik CT350 Comet T EH (parallel test) | – | – | 2020 | Berlin |
| Compact tester | Dr. Eschke Elektronik CT350 Comet C | – | – | 2013 | Berlin |
| Combination tester | Dr. Eschke Elektronik CT350 Comet T | – | – | 2009 | Berlin |
| Semiconductor and combination tester | Dr. Eschke Elektronik CT350 Comet R / CT3xx Power Rack | – | – | 2007 | Berlin |
| Semiconductor and component tester | Dr. Eschke Elektronik CT350 Comet S | – | – | 2006 | Berlin |
| High-speed combination tester | Dr. Eschke Elektronik CT300 Galaxy / CT300 Meteor / CT300 Satellite | – | – | 2005 | Berlin |
| Board, semiconductor and final tester | Dr. Eschke Elektronik CT300 Basic System | – | – | 2004 | Berlin |
| High speed combination tester | Dr. Eschke Elektronik CT250 / CT250M | – | – | 2001 | Berlin |
| Functional tester | Dr. Eschke Elektronik DAT500 (500 MS/s analog, 100 MS/s digital, 1024 channels) | – | – | 1998 | Berlin |
| Chip card tester | Dr. Eschke Elektronik DAT100-CD | – | – | 2001 | Berlin |
| Digital-analog tester | Dr. Eschke Elektronik DAT100M (100 MS/s analog, 1024 digital channels) | – | – | 1996 | Berlin |
| Digital-analog tester | Dr. Eschke Elektronik DAT100 (100 MS/s analog, 256 digital channels) | – | – | 1995 | Berlin |
| Digital tester | Dr. Eschke Elektronik DT30 (50 MS/s, 88 channels) | – | – | 1993 | Berlin |
| Digital tester | Dr. Eschke Elektronik DKTS-2 (30 MS/s, 88 channels) | – | – | 1990 | Berlin |
| Repair Station | Dr. Eschke Elektronik server-based logging and repair data management | – | – | – | – |
| Module: high speed digital module | Dr. Eschke Elektronik DM1G (16/32 MSteps, up to 1.5 GS/s / 6 GS/s burst mode) | – | – | 2020 | – |
| Module: measurement module capacitance/inductance | Dr. Eschke Elektronik XIMP20 | – | – | 2020 | – |
| Module: analog module | Dr. Eschke Elektronik AM30-4B (30 V, 300 mA, 24 bit) | – | – | 2017 | – |
| Module: high speed color analyzer | Dr. Eschke Elektronik CDM24 | – | – | 2017 | – |
| High voltage relay matrix | Dr. Eschke Elektronik SC370 (370 Vss) | – | – | 2011 | Berlin |
Additional services
Reference customers
Quality
Test systems with test coverage analysis, logging and statistics as well as easy integration into quality management systems; repair data management with Repair Station is server-based and paperless.
| Evidence | Berlin |
|---|---|
| Customer-origin QMS integration |
Company History
- 1990
Company founded; digital tester DKTS-2, developments for fiber optic TRX and FDDI
- 1993
Digital tester DT30
- 1995
Digital-analog tester DAT100, gigabit transceiver
- 1996
Digital-analog tester DAT100M
- 1997
DAT-IrDA, test techniques ATM, STM-1, STM-4
- 1998
Functional tester DAT500
- 1999
ATM tester DAT-ATM
- 2001
CT250/CT250M, chip card tester DAT100-CD
- 2003
MDA techniques, testing of automotive modules
- 2004
CT300 Basic System, T-B1 test system for railway safety technology
- 2005
CT300 series (Galaxy, Meteor, Satellite), T-B2
- 2006
CT350 Comet S
- 2007
CT350 Comet R, CT3xx Power Rack
- 2009
CT350 Comet T, TestOS4
- 2010
CT300 Satellite opt, UIF
- 2011
High voltage relay matrix SC370
- 2013
CT350 Comet C
- 2015
UEM3, XPR5, DM300-32HV, Göpel BST integration
- 2017
SA5-E, AM30-4B, CDM24
- 2020
CT350 Comet T EH with parallel test, modules DM1G, XIMP20, PSM2M, TCP/IP interface