Manufacturer of sample preparation instruments for electron microscopy, including ion mills, plasma cleaners and TEM specimen holders.
E.A. Fischione Instruments, Inc.
Export, PA (USA) · Hanau (Germany) · Taipei (Taiwan)New on Amplifa
About Fischione Instruments
E.A. Fischione Instruments, Inc. develops and manufactures sample preparation instruments for electron microscopy (TEM/SEM). The portfolio includes concentrated and broad ion beam mills (NanoMill, PicoMill, TEM Mill, SEM Mill, TrionMill, WaferMill, ChipMill), plasma cleaners, vacuum storage and pumping stations, classic preparation instruments such as the Automatic Twin-Jet Electropolisher, Specimen Grinder, Ultrasonic Disk Cutter and Dimpling Grinder, as well as a wide range of TEM tomography and cryo transfer specimen holders. Processes include, among others, ion beam thinning, electropolishing, plasma cleaning and precision machining; materials processed include metals such as aluminium and stainless steel as well as silicon and germanium. The products are used in over 500 research laboratories worldwide, primarily in electron microscopy, materials science, life sciences and the semiconductor industry. Sales are handled directly in the USA and through an international sales network; the German representative is Fischione Germany GmbH in Hanau. Company headquarters and production are located in Export, Pennsylvania, USA.
- Site
- Export, PA
- Processes
- Ion beam sample preparation (Ion Milling), Plasma cleaning (Plasma Cleaning), Electropolishing (Twin-Jet Electropolishing), Sample preparation for electron microscopy (TEM/SEM), Service contracts (Premiere/Preferred) with annual preventive maintenance, On-site and in-factory service, Training, Software support
- Materials
- Metals (for electropolishing/twin-jet), Aluminium (3 mm disc, electrolytically thinned), Germanium (Ge), Silicon (Si), Type 410 stainless steel, Type 303 stainless steel, Low-carbon steel, Zone-refined iron
- Certificates
- Annual preventive maintenance, Helium leak test (in-factory), Ion beam calibration, ISO 9001
- Founded
- 1966
- Industries
- Electron microscopy, Materials science, Life sciences, Academic and research institutions, Semiconductor industry, Academic/research institutions
- 01
Engineering and product design
- 02
Precision manufacturing in Export, PA
- 03
Assembly and testing
- 04
Direct sales USA / international sales network
- 05
Service, maintenance and spare parts supply
Materials and Processes
Aluminium
3-mm discs for electrolytic thinning of TEM samples.
Silicon
Semiconductor material prepared by ion beam or jet thinning.
Germanium
Semiconductor material for electrolytic and ion beam thinning.
Stainless Steel Type 410
Example material for twin-jet electropolishing of metal discs.
Stainless Steel Type 303
Example material for electrolytic thinning with automatic shutdown.
Low-carbon steel
Metal material for electrolytic sample preparation.
Zone-refined iron
High-purity iron as a preparation material in research.
Sites
Export, PA
USHeadquarters and production
- Materials
- Aluminium, stainless steel, silicon, germanium
- Model 1040 NanoMill
- Model 1080 PicoMill
- Model 1051 TEM Mill
- Model 1061 SEM Mill
- Model 1062 TrionMill
- Model 1063 WaferMill
- Model 1064 ChipMill
- Model 1020 Plasma Cleaner
- Model 1070 NanoClean
Hanau
DESales (Fischione Germany GmbH)
Taipei
TWTaiwan Sales Office
Instruments and Assemblies
Inside the production
Industries
Processes & technical limits
| Processes | Tolerance | Max. part | Weight | Lot size | Materials |
|---|---|---|---|---|---|
| Ion beam sample preparation (Ion Milling)Surface | – | – | – | – | – |
| Plasma cleaning (Plasma Cleaning)Surface | – | – | – | – | – |
| Electropolishing (Twin-Jet Electropolishing)Surface | – | – | – | – | Metals |
| Sample preparation for electron microscopy (TEM/SEM)Testing | – | – | – | – | – |
36 Anlagen & Maschinen
| Machine | Manufacturer / model | Quantity | Working area | Year built | Site |
|---|---|---|---|---|---|
| Ion mill (Concentrated Ion Beam Mill) | E.A. Fischione Instruments Model 1040 NanoMill TEM specimen preparation system | – | – | – | Export, PA, USA |
| Ion mill (Concentrated Ion Beam Mill) | E.A. Fischione Instruments Model 1080 PicoMill TEM specimen preparation system | – | – | – | Export, PA, USA |
| Broad Ion Beam Mill (TEM) | E.A. Fischione Instruments Model 1051 TEM Mill | – | – | – | Export, PA, USA |
| Broad Ion Beam Mill (SEM) | E.A. Fischione Instruments Model 1061 SEM Mill | – | – | – | Export, PA, USA |
| Broad Ion Beam Mill (TrionMill) | E.A. Fischione Instruments Model 1062 TrionMill | – | – | – | Export, PA, USA |
| Ion Beam Delayering System (Wafer) | E.A. Fischione Instruments Model 1063 WaferMill ion beam delayering solution | – | – | – | Export, PA, USA |
| Ion Beam Mill (Chip) | E.A. Fischione Instruments Model 1064 ChipMill | – | – | – | Export, PA, USA |
| Plasma Cleaner | E.A. Fischione Instruments Model 1020 Plasma Cleaner | – | – | – | Export, PA, USA |
| Plasma Cleaner | E.A. Fischione Instruments Model 1070 NanoClean | – | – | – | Export, PA, USA |
| Vacuum Storage Container | E.A. Fischione Instruments Model 9010 Vacuum Storage Container | – | – | – | – |
| Vacuum Pumping Station | E.A. Fischione Instruments Model 9020 Vacuum Pumping Station | – | – | – | – |
| Turbo Pumping Station | E.A. Fischione Instruments Model 9030 Turbo Pumping Station | – | – | – | – |
| Automatic Twin-Jet Electropolisher | E.A. Fischione Instruments Model 110 | – | – | – | – |
| Specimen Punch | E.A. Fischione Instruments Model 130 | – | – | – | – |
| Specimen Grinder | E.A. Fischione Instruments Model 160 | – | – | – | – |
| Ultrasonic Disk Cutter | E.A. Fischione Instruments Model 170 | – | – | – | – |
| XTEM Prep Kit | E.A. Fischione Instruments Model 180 | – | – | – | – |
| Dimpling Grinder | E.A. Fischione Instruments Model 200 | – | – | – | – |
| Tomography Holder (TEM) | E.A. Fischione Instruments Model 2020 Advanced Tomography Holder | – | – | – | – |
| Tomography Holder (TEM) | E.A. Fischione Instruments Model 2021 Analytical Tomography Holder | – | – | – | – |
| Tomography Holder (TEM) | E.A. Fischione Instruments Model 2022 Compact Advanced Tomography Holder | – | – | – | – |
| Tomography Holder (TEM) | E.A. Fischione Instruments Model 2023 Compact Analytical Tomography Holder | – | – | – | – |
| Tomography Holder (TEM) | E.A. Fischione Instruments Model 2023 Analytical Tomography Holder for Ultra-X | – | – | – | – |
| Tomography Holder (TEM) | E.A. Fischione Instruments Model 2030 Ultra-Narrow Gap Tomography Holder | – | – | – | – |
| Tomography Holder (TEM) | E.A. Fischione Instruments Model 2040 Dual-Axis Tomography Holder | – | – | – | – |
| Tomography Holder (TEM, motorized) | E.A. Fischione Instruments Model 2045 Motorized Dual-Axis Tomography Holder | – | – | – | – |
| Tomography Holder (TEM) | E.A. Fischione Instruments Model 2050 On-Axis Rotation Tomography Holder | – | – | – | – |
| Tomography Holder (TEM, Cryo) | E.A. Fischione Instruments Model 2550 Cryo Transfer Tomography Holder | – | – | – | – |
| Specimen Holder (Cryo Cartridge) | E.A. Fischione Instruments Model 2552 Cryo Cartridge Specimen Holder | – | – | – | – |
| Tomography Holder (TEM, Vacuum Transfer) | E.A. Fischione Instruments Model 2560 Vacuum Transfer Tomography Holder | – | – | – | – |
| Ion Mill (Legacy) | E.A. Fischione Instruments Model 1010 Ion Mill | – | – | – | Export, PA, USA |
| Ion Mill (Legacy) | E.A. Fischione Instruments Model 1050 TEM Mill | – | – | – | Export, PA, USA |
| Ion Mill (Legacy) | E.A. Fischione Instruments Model 1060 SEM Mill | – | – | – | Export, PA, USA |
| Plasma Cleaner (Legacy) | E.A. Fischione Instruments Model 1400 Plasma Cleaner | – | – | – | Export, PA, USA |
| Ion Mill (Legacy) | E.A. Fischione Instruments Model 3000 Ion Mill | – | – | – | Export, PA, USA |
| Plasma Cleaner (Legacy, Gen. 1) | E.A. Fischione Instruments Model 1020 Plasma Cleaner (Gen. 1) | – | – | – | Export, PA, USA |
Additional services
Quality and Service
Quality is based on in-house precision manufacturing and product testing at the Export, PA site; annual preventive maintenance (on-site or in-factory), including helium leak testing, vacuum checking, ion beam calibration and functional testing, ensures instrument performance.
| Evidence | Export, PA |
|---|---|
| Annual preventive maintenance | |
| Helium leak test (in-factory) | |
| Ion beam calibration | |
| ISO 9001 |
History
- 1966
E.A. Fischione Instruments, Inc. founded by Eugene A. Fischione; the first product is the Automatic Twin-Jet Electropolisher.
- 1986
Paul Fischione, son of the founder, takes over the company.
- 2002
Support for legacy products such as Model 1010 Ion Mill, Model 1400 Plasma Cleaner and Model 3000 Ion Mill is gradually discontinued.
- 2018
Phase-out of support for Model 1050 TEM Mill and Model 1060 SEM Mill beginning; proprietary spare parts continue to be offered beyond that.
- heute
Products in over 500 research laboratories worldwide; direct sales in the USA, internationally through a sales network.