Development, production and service of UHV surface electron microscopes (LEEM/PEEM) and accessories
ELMITEC Elektronenmikroskopie GmbH
Clausthal-Zellerfeld, GermanyNew on Amplifa
About ELMITEC
ELMITEC Elektronenmikroskopie GmbH develops, manufactures and services ultra-high-vacuum cathode-lens surface electron microscopes (LEEM and PEEM) as well as accessories for these and other surface science instruments. The company, founded in 1995, emerged from the working group of Prof. Ernst Bauer, the inventor of the Low Energy Electron Microscope (LEEM); most staff members come from this group and have many years of experience in UHV surface electron microscopy and surface science instrumentation. For over 15 years, ELMITEC has been the main supplier of LEEM and PEEM systems worldwide. The product portfolio includes, in addition to the microscopes, an aberration corrector as an upgrade or as a complete AC-LEEM (lateral resolution 1.9 nm in the factory acceptance test) as well as an Imaging Energy Analyzer with a kinetic energy resolution of around 115 meV in spectroscopic mode. Spare parts such as sample cartridges and intensive customer support round out the offering. As a small, specialized company, ELMITEC adapts its instruments to customer requirements. The company is headquartered in Clausthal-Zellerfeld.
- Site
- Clausthal-Zellerfeld
- Processes
- Development, production and service of UHV electron microscopes (LEEM, PEEM) and accessories, Development, production and service of UHV cathode-lens surface electron microscopes, Accessories and spare parts (e.g. sample cartridges), Aberration corrector as an upgrade or AC-LEEM, Imaging Energy Analyzer, Customer support
- Materials
- Ultra-high-vacuum instrumentation, Aberration corrector, Imaging Energy Analyzer
- Founded
- 1995
- Industries
- Surface science, Scientific instrumentation, Research / UHV electron microscopy
- 01
Development
- 02
Manufacturing and assembly
- 03
Factory acceptance test
- 04
Delivery
- 05
Service and spare parts
Technology & Components
Ultra-high-vacuum instrumentation
Components are designed for UHV compatibility for surface science instruments.
Aberration corrector
Improves lateral resolution to 1.9 nm, available as an upgrade or complete system.
Imaging Energy Analyzer
Energy analysis with a kinetic resolution of approx. 115 meV in spectroscopic mode.
Locations
Clausthal-Zellerfeld
DEDevelopment, production, service (headquarters)
- Materials
- UHV components
- LEEM (Low Energy Electron Microscope)
- PEEM (Photoemission Electron Microscope)
- Aberration corrector / AC-LEEM
- Imaging Energy Analyzer
- Sample cartridges / spare parts
Instruments & Components
Inside the production
Industries
Processes & technical limits
| Processes | Tolerance | Max. part | Weight | Lot size | Materials |
|---|---|---|---|---|---|
| Development, production and service of UHV electron microscopes (LEEM, PEEM) and accessoriesEngineering | – | – | – | – | – |
5 Anlagen & Maschinen
| Machine | Manufacturer / model | Quantity | Working area | Year built | Site |
|---|---|---|---|---|---|
| LEEM (Low Energy Electron Microscope) | ELMITEC Elektronenmikroskopie GmbH | – | – | seit 1995 | Clausthal-Zellerfeld, Germany |
| PEEM (Photoemission Electron Microscope) | ELMITEC Elektronenmikroskopie GmbH | – | – | – | Clausthal-Zellerfeld, Germany |
| Aberration corrector / AC-LEEM | ELMITEC Elektronenmikroskopie GmbH | – | lateral resolution 1.9 nm (factory acceptance test) | – | Clausthal-Zellerfeld, Germany |
| Imaging Energy Analyzer (spectroscopy) | ELMITEC Elektronenmikroskopie GmbH | – | kinetic energy resolution ~115 meV in spectroscopic mode | – | Clausthal-Zellerfeld, Germany |
| Sample cartridges / spare parts | ELMITEC Elektronenmikroskopie GmbH | – | – | – | Clausthal-Zellerfeld, Germany |
Additional services
Company History
- 1995
Founded; emerged from the working group of Prof. Ernst Bauer, the inventor of the LEEM
Main supplier of LEEMs and PEEMs worldwide for over 15 years; introduction of the aberration corrector (resolution 1.9 nm) and the Imaging Energy Analyzer (approx. 115 meV)