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ERS electronic – Fertigung

Thermal Chuck systems for wafer testing and debonding solutions for Advanced Packaging since 1970

ERS electronic Logo

ERS electronic GmbH

Germering · Barbing · Dallas, TX (USA) · Zhubei (Taiwan) · Shanghai (China)New on Amplifa

1970Founded (first thermal chuck)
10,000+Thermal chucks sold since 1972
2 bn+ICs debonded on ERS systems
5Locations worldwide
-65 °C to +550 °CTemperature range of the thermal chucks

About ERS electronic

ERS electronic GmbH, headquartered in Germering near Munich, develops and manufactures thermal management solutions for the semiconductor industry. Founded in 1970, the company produced the first thermal chuck for wafer testing and, with over 10,000 chucks sold since 1972, of which around 85 % are still in operation, is regarded as the pioneer of thermal wafer testing technology. The product portfolio includes thermal chuck systems (AirCool®, AC3, AirCool® PRIME) with temperatures from -65 °C to +550 °C as well as machines for Advanced Packaging: thermal and photothermal debonding systems (ADM, APDM650, MDM, MPDM, LumosON™), warpage adjustment (WAT330) and the 3D wafer profiler Wave 3000. More than 25 % of the workforce are developers; over 95 % of production takes place at the company's own plant near Munich, enabling same-day prototyping from its own CAD/CAM chain. Materials processed include silicon, SiC, GaN and GaAs wafers as well as molded wafers and panels up to 650×650 mm. Customers include wafer probing, FOWLP/FOPLP manufacturing, and automotive and safety electronics; worldwide, more than two billion ICs have been debonded on ERS systems.

Site
Germering
Processes
Thermal Debonding (FOWLP), Thermal Debonding (FOPLP Panel-Level), PhotoThermal Debonding, Warpage Adjustment (TriTemp Slide), Warpage Metrology (3D Wafer Profiling), Thermal Wafer Testing (Wafer Probing Thermal Chucks), Laser Marking (Wafer/Panel Frontside, 1064 nm Diode-pumped), Temporary Carrier Bonding and Debonding (Panel-Level, 310 x 310 mm)
Materials
Silicon, Silicon Carbide, Gallium Nitride, Gallium Arsenide, Molded wafer/panel, Molded Wafer/Panel, AirCool® air cooling, ACP air management
Certificates
ISO 9001:2015
Founded
1970
Industries
Semiconductor industry (wafer test/wafer probing), Advanced Packaging (FOWLP/FOPLP), Semiconductor test and production, Automotive and safety electronics, Automotive/safety electronics (tested ICs)
  1. 01

    Design/Engineering (in-house development department)

  2. 02

    CAM manufacturing at own plant (>95 % of production in-house)

  3. 03

    Quality assurance by an independent QA group

  4. 04

    SECS/GEM integration and commissioning

  5. 05

    Customer service/support and warpage adjustment

Materials & Processes

Si

Silicon

Standard substrate material for wafer testing and thermal debonding up to 330 mm.

SiC

Silicon Carbide

Wide-bandgap semiconductor material processed on ERS debonding systems.

GaN

Gallium Nitride

Material for power semiconductors, compatible with ERS debonding and warpage processes.

GaAs

Gallium Arsenide

III-V semiconductor material for RF applications in thermal debonding.

PLP

Molded Wafer/Panel

Reconstituted wafers and panels for FOWLP/FOPLP, panels up to 650×650 mm.

AC

AirCool® air cooling

Patented cooling using CDA as the sole refrigerant, introduced in the early 1990s.

ACP

ACP air management

Patented two-pass heat exchanger system of the AC3 with turbo cooling and icing prevention.

TriTemp

TriTemp Slide

Contactless thermal conditioning and transport process for warpage correction of reconstituted wafers and panels.

LD

Laser Marking (1064 nm)

Diode-pumped laser scribing for wafer/panel frontside marking and traceability.

Locations

Standort Germering

Germering

DE

Headquarters (Stettiner Straße 3+5), production near Munich

Materials
Silicon, SiC, GaN, GaAs, molded wafer
  • Thermal chuck systems AirCool®, AC3, AirCool® PRIME
  • ADM200/ADM330 Gen 3
  • MDM200/MDM330
  • CAD/CAM machine fleet
  • Thermal imaging tools

Barbing

DE

Production and R&D site ERS Barbing, Competence Center Advanced Packaging (Liebigstraße 1)

Materials
Molded wafer/panel
  • APDM650
  • MPDM
  • WAT330
  • Wave 3000
  • LumosON™ LUM300A/LUM600S1

Dallas, TX

US

ERS Americas – sales/support

Zhubei

TW

ERS Taiwan – sales/demonstration center

Shanghai

CN

ERS China – sales/support

Components & Systems

ADM330 Gen 3 – Automatic Debond Machine
ADM330 Gen 3 – Automatic Debond MachineThermal debonding · FOWLP
APDM650 – Automatic Panel Debond Machine
APDM650 – Automatic Panel Debond MachineThermal debonding · FOPLP
MPDM – Manual Panel Debond Machine
MPDM – Manual Panel Debond MachineManual debonding · R&D/pilot lines
AC3 with ACP air management technology
AC3 with ACP air management technologyThermal chuck · wafer probing
TRM310A Thermal Chuck System
TRM310A Thermal Chuck SystemThermal chuck · wafer probing
ADM330 – automatic debond system
ADM330 – automatic debond systemThermal debonding · Advanced Packaging

Inside the production

ERS Chuck Booster
ERS Chuck Booster
ERS Thermal Chuck Technology
ERS Thermal Chuck Technology
ISO 9001 certification
ISO 9001 certification
TÜV certification
TÜV certification

Industries

Semiconductor industry (wafer test/wafer probing)Advanced Packaging (FOWLP/FOPLP)Semiconductor test and productionAutomotive and safety electronicsAutomotive/safety electronics (tested ICs)

Processes & technical limits

ProcessesToleranceMax. partWeightLot sizeMaterials
Thermal Debonding (FOWLP)Additive–330 mm wafer––Silicon, Silicon Carbide (SiC), Gallium Nitride (GaN), Gallium Arsenide (GaAs), Molded wafer
Thermal Debonding (FOPLP Panel-Level)Additive–650 x 650 mm × 650 mm––Molded panel, Silicon, Silicon Carbide (SiC), Gallium Nitride (GaN), Gallium Arsenide (GaAs)
PhotoThermal DebondingAdditive––––Molded wafer/panel, Silicon, Silicon Carbide (SiC), Gallium Nitride (GaN), Gallium Arsenide (GaAs)
Warpage Adjustment (TriTemp Slide)Heat treatment––––Silicon, Molded wafer/panel
Warpage Metrology (3D Wafer Profiling)Testing–––––
Thermal Wafer Testing (Wafer Probing Thermal Chucks)Testing–300 mm wafer (200 mm available)–––
Laser Marking (Wafer/Panel Frontside, 1064 nm Diode-pumped)Surface–––––
Temporary Carrier Bonding and Debonding (Panel-Level, 310 x 310 mm)Additive–310 x 310 mm × 310 mm–––

13 Anlagen & Maschinen

MachineManufacturer / modelQuantityWorking areaYear builtSite
Thermal Chuck SystemERS electronic AirCool®–––Germering/Munich
Thermal Chuck SystemERS electronic AirCool® PRIME–200 mm and 300 mm wafers2018–
Thermal Chuck SystemERS electronic AC3 (AC3 Fusion, ACP technology)––––
Automatic Debond MachineERS electronic ADM330 (Gen 3)–300/330 mm wafers; 3126 x 1856 x 2105 mm; temperature RT to +240°C; max. input warpage ±5 mm–Germering
Automatic Debond MachineERS electronic ADM200–200 mm wafers––
Automatic Panel Debond MachineERS electronic APDM650–Panels up to 650 x 650 mm; temperature RT-260°C; uniformity ±3°C; 4.6 x 3 m2021–
Manual/Semi-automatic Debond MachineERS electronic MDM200 / MDM330–200/300/330 mm wafers; temperature -10°C to +260°C; 2000 x 1050 x 1600 mm; 600 kg––
Manual Panel Debond MachineERS electronic MPDM–Panels up to 615 x 615 mm, wafers 200/300 mm; temperature -10°C to 260°C; input warpage ±10 mm––
Automatic Warpage Adjust ToolERS electronic WAT330––2023–
3D Wafer ProfilerERS electronic Wave 3000––2024–
PhotoThermal Debond Machine (Automatic)ERS electronic LumosON™ LUM300A––––
PhotoThermal Debond Machine (Semi-Automatic, Wafer and Panel)ERS electronic LumosON™ LUM600S1––––
Fully Automated Panel-Level Packaging SystemERS electronic–310 x 310 mm substrates; 13 panels per hour2026–

Additional services

Design/Engineering (in-house development department, >25 % of workforce)Manufacturing (>95 % of production at own plant near Munich)Customer service/supportWarpage adjustmentLaser marking/wafer ID markingSECS/GEM and GEM300 integrationPR & Marketing

Reference customers

MPI Corporation (co-development of AirCool® PRIME, integration into the TS2000-SE prober)Fraunhofer IZM (using the MPDM since 2018)

Quality

An independent QA group with direct access to development and manufacturing monitors product quality throughout. ERS is certified to ISO 9001:2015 by TÜV SÜD (certificate 12 100 30597 TMS, valid until 2028-02-07).

EvidenceGermeringBarbing
ISO 9001:2015

History

  1. 1970

    ERS produces the first thermal chuck for wafer testing.

  2. 1972

    Since 1972, over 10,000 chucks have been sold, approximately 85 % of which are still in operation today.

  3. Späte 1980er

    True production cold testing in automatic wafer probers becomes possible for the first time with the ERS SuperCool®.

  4. Anfang der

    Conversion to purely air-cooled systems; introduction of AirCool® technology with CDA as the sole refrigerant.

  5. 2005

    Introduction of the AC3 system with patented ACP air management technology.

  6. 2009

    Delivery of the first automatic 200-mm system (ADM200).

  7. 2011

    Delivery of the first automatic 300-mm system (ADM330).

  8. 2018

    Delivery of the first manual panel-level system (MPDM); introduction of AirCool® PRIME (300 mm, later 200 mm); partnership with Woowon Technology (Korea).

  9. 2019

    Microworld (France) becomes sales partner for France, Switzerland and North Africa.

  10. 2021

    Announcement of the automatic panel-level machine APDM650 (up to 650×650 mm).

  11. 2022

    Market launch of ADM330 Gen 3, WAT330 and the Wave 3000 3D wafer profiler.

  12. 2024

    Global Marketing Services (India) becomes sales partner; opening of the production and R&D site ERS Barbing including the Competence Center Advanced Packaging.

  13. 2025

    New ISO 9001:2015 certification by TÜV SÜD (valid until 2028).

  14. 2026

    Announcement of a fully automatic panel-level packaging system for 310×310-mm substrates.

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