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Freiberg Instruments – Fertigung

Development and manufacturing of measurement and automation systems for the semiconductor, quartz and photovoltaic industries

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Freiberg Instruments GmbH

Freiberg · ShanghaiNew on Amplifa

+100Employees
3.000+Installed measurement systems worldwide
11Sales offices worldwide
2Sites (Freiberg, Shanghai)

About Freiberg Instruments

Freiberg Instruments GmbH, headquartered in Freiberg (Saxony), develops and manufactures precision metrology and automation solutions for the semiconductor, microelectronics, photovoltaic, chemical and medical technology industries. The product range includes X-ray diffractometers (XRD) for crystal orientation and quality control of silicon, SiC and quartz samples, contactless lifetime and resistivity measurement systems (MDP), surface photovoltage spectroscopy, luminescence readers (TL/OSL), battery formation systems, radiation monitoring systems as well as Raman sensors. The systems are customized and integrated into production lines; this includes robotic handling, software-controlled workflows, training, technical support and project-specific packaging including ISPM-15 wooden crates. The company originated as a university spin-off and has more than 20 years of experience with over 3,000 installed measurement systems worldwide. With more than 100 employees and 11 sales offices, Freiberg Instruments supplies industry and research cooperations such as Fraunhofer Institutes and TU Bergakademie Freiberg.

Site
Freiberg
Processes
X-ray diffractometry (XRD) for crystal orientation, sample alignment and quality control, Resistivity Mapping (RESmap, THzmap) for semiconductor quality control, PID testing (Potential Induced Degradation) for c-Si solar cells and mini-modules, Luminescence dating and dosimetry (TL/OSL systems), Battery cell formation and testing (Syntropic Cell Technology / FormationIQ), Radiation monitoring (Radiation Monitoring Systems), Raman sensing for polymer and semiconductor sorting, Magnetic suspension balance for high-precision sorption measurements
Materials
Silicon (mono- and multicrystalline), Silicon carbide, Gallium arsenide, Cadmium telluride, Indium phosphide, Zinc sulfide, Germanium, Gallium nitride
Certificates
ISO 9001:2015, EcoVadis Bronze, CE Compliance
Employees
+100 experts
Industries
Semiconductor, Microelectronics, Photovoltaics, Chemical Industry, Medical Technology, Battery Technology
  1. 01

    Research & Development

  2. 02

    System Design & Engineering

  3. 03

    Manufacturing & Software Integration

  4. 04

    Automated Sample Handling & Commissioning

  5. 05

    Quality Control according to ISO 9001

  6. 06

    Logistics & Packaging

  7. 07

    Training & Technical Support

Materials & Measurement Technologies

XRD

X-ray Diffractometry

Crystal orientation, sample alignment and quality control on Si, SiC and quartz samples.

MDP

Microwave Detected Photoconductivity

Contactless, non-destructive lifetime and resistivity measurement according to SEMI PV9-1110.

SPS

Surface Photovoltage Spectroscopy

Contactless characterization of electro-optical material parameters.

Si

Silicon

Mono- and multicrystalline ingots, bricks and wafers up to 450 mm diameter.

SiC

Silicon Carbide

Automated 200-mm ingot processing for OD/notch specifications.

Quarz

Quartz

Bar alignment, wafer analysis and blank sorting with ≤10 arcsec standard deviation.

TL/OSL

Luminescence Dosimetry

TL/OSL systems for geochronology, archaeology and radiation dosimetry.

Sites

Standort Freiberg

Freiberg

DE

Headquarters, manufacturing and development

Materials
Si, SiC, GaAs, CdTe, InP, ZnS, Ge, GaN, quartz
  • XRD series (Ingot XRD, Ingot XRD SiC, XRDmap Pro, Omega/Theta XRD, DDCOM, SDCOM, Wafer XRD)
  • Quartz XRD series
  • MDPpro / MDPpro 850+
  • RESmap / THzmap
  • HR-SPSmap, SPSresearch, SPSmap Heat
  • PIDcon bifacial
  • lexsyg TL/OSL readers
  • FormationIQ
  • MSBsorp
  • RAMSES-4-CE
  • Radiation monitoring systems (SmartKONT, GM 2100 and others)

Systems & Components

Ingot XRD SiC
Ingot XRD SiCX-ray diffractometry · Semiconductor
XRDmap Pro
XRDmap ProInline wafer orientation mapping · Semiconductor
MDPmap
MDPmapLifetime measurement · Photovoltaics
MDPpro 850+
MDPpro 850+Lifetime & resistivity measurement · Photovoltaics
RESmap
RESmapResistivity Mapping · Semiconductor
THzmap
THzmapTHz mapping · Semiconductor
Quartz Blank XRD
Quartz Blank XRDBlank sorting · Quartz industry
HR-SPSmap
HR-SPSmapSurface Photovoltage Spectroscopy · Research

Inside the production

Omega/Theta XRD – Crystal orientation
Omega/Theta XRD – Crystal orientation
Wafer XRD – Automated wafer quality control
Wafer XRD – Automated wafer quality control
PolarityPen – Determination of crystal surface polarity
PolarityPen – Determination of crystal surface polarity
SPSresearch – Variable excitation source
SPSresearch – Variable excitation source
SPSmap Heat – Integration into glovebox
SPSmap Heat – Integration into glovebox

Industries

SemiconductorMicroelectronicsPhotovoltaicsChemical IndustryMedical TechnologyBattery TechnologyRadiation MonitoringResearchMicroelectronics

Processes & technical limits

ProcessesToleranceMax. partWeightLot sizeMaterials
X-ray diffractometry (XRD) for crystal orientation, sample alignment and quality controlTesting––––Si, SiC, Quartz
Testing≤ 10 arcsec standard deviation; alignment ±0.03° (AT & TF)––up to 700 blanks/h or 350 wafers/hQuartz
Resistivity Mapping (RESmap, THzmap) for semiconductor quality controlTesting––––Si, Semiconductor
Testing–210 x 210 mm (brick)–>240 bricks/day or >720 wafers/daySi, SiC, Gallium arsenide, CdTe, InP, ZnS, Perovskite, Oxides, Wide-bandgap materials, Epitaxial layers, Germanium, GaN
Testing–850 mm or longer (brick) × 125x125 to 210x210 mm (ingot)––Si (monocrystalline), Perovskite
PID testing (Potential Induced Degradation) for c-Si solar cells and mini-modulesTesting–up to 210 x 210 mm––c-Si (solar cells)
Luminescence dating and dosimetry (TL/OSL systems)Testing–––––
Battery cell formation and testing (Syntropic Cell Technology / FormationIQ)Testing–––GWh-scale (FormationIQ modules)–
Radiation monitoring (Radiation Monitoring Systems)Testing–––––
Raman sensing for polymer and semiconductor sortingTesting––––Plastic, Semiconductor
Magnetic suspension balance for high-precision sorption measurementsTesting–––––
Testing––––Semiconductor
Double Prism Monochromator (DPM100) for spectral analysisTesting–––––
Engineering–––––
Engineering–––––
Research & Development – new metrology development, prototyping & testingEngineering–––––
Training and Application Expertise (on-site, remote, in Freiberg)Engineering–––––
Technical Support (remote assistance, repairs, spare parts & upgrades)Engineering–––––
Engineering–––––
Ingot XRD – ingot processing for OD/notch specifications (SiC, 200 mm)Testing–200 mm (SiC ingot)––SiC

14 Anlagen & Maschinen

MachineManufacturer / modelQuantityWorking areaYear builtSite
–Freiberg Instruments–––Freiberg
Quartz XRD diffractometer (bar/wafer/blank, X-ray tube 1.5 kW Cu anode)Freiberg Instruments Quartz XRD series (Quartz Bar XRD, Quartz Wafer XRD, Quartz Blank XRD)–Wafers 20x20 to 80x80 mm; blanks 1x1 to 17x17 mm–Freiberg
Lifetime measurement system (μPCD/MDP)Freiberg Instruments MDPpro–––Freiberg
Lifetime & resistivity measurement system for monocrystalline Si ingots/bricks/wafersFreiberg Instruments MDPpro 850+–––Freiberg
Resistivity mapping systemFreiberg Instruments RESmap / THzmap–––Freiberg
Surface photovoltage spectroscopy systemsFreiberg Instruments HR-SPSmap, SPSresearch, SPSmap Heat–––Freiberg
Double prism monochromatorFreiberg Instruments DPM100–––Freiberg
Benchtop PID testerFreiberg Instruments PIDcon bifacial–Sample up to 210x210 mm; unit 350x330x280 mm, approx. 20 kg–Freiberg
TL/OSL luminescence readersFreiberg Instruments–––Freiberg
Battery formation & testing systemsFreiberg Instruments FormationIQ Module, FormationIQ Matrix, FormationIQ Board–––Freiberg
Magnetic suspension balanceFreiberg Instruments MSBsorp–––Freiberg
Raman sensor (fully automated, for polymer/semiconductor sorting)Freiberg Instruments RAMSES-4-CE–––Freiberg
Radiation monitoring systemsFreiberg Instruments SmartKONT, Comet2500, SmartRAY2, Beta-Aerosol monitor, GM 2100–––Freiberg
Angle SorterFreiberg Instruments Angle Sorter–––Freiberg

Additional services

CustomizationAutomationResearch and DevelopmentTraining and Application ExpertiseTechnical SupportLogistics and Packaging

Reference customers

Fraunhofer CSP (development cooperation)Fraunhofer IISBFraunhofer ISEHZDRNaMLabHelmholtz-Zentrum BerlinQ-CellsTopticaTU Bergakademie FreibergHS Anhalt

Quality & Certification

The systems are manufactured according to ISO 9001:2015 and are CE compliant; quality assurance includes automated measurement data evaluation, repeatability > 99 % and traceable measurement results.

EvidenceFreiberg
ISO 9001:2015
EcoVadis Bronze
CE Compliance

History

  1. 2005

    Founded as a university spin-off; more than 20 years of experience in the development of metrology.

  2. 2024

    More than 3,000 installed measurement systems worldwide, 11 sales offices, over 100 employees.

  3. 2030

    Goal: net zero for operational emissions and EcoVadis Gold.

  4. 2040

    Goal: net zero across the entire value chain.

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