Develops and manufactures instruments for coating thickness measurement, material analysis and material testing.
HELMUT FISCHER GMBH
Sindelfingen (Headquarters)New on Amplifa
About Helmut Fischer
HELMUT FISCHER GMBH, headquartered in Sindelfingen, has been developing and producing measurement solutions for coating thickness measurement, material analysis and material testing since 1953. The portfolio includes X-ray fluorescence instruments (XRF) for coating thickness and elemental analysis, tactile instruments for magnetic-inductive and eddy-current-based measurement methods, conductivity and ferrite content meters, and automated measuring systems for inline quality control. This is complemented by polycapillary X-ray optics for OEM applications, calibration standards, and software such as WinFTM and FISIQ X. Fields of application include, among others, electronics, semiconductor manufacturing, electroplating, automotive, precious metals, aerospace, and testing laboratories. With more than 800 employees, 21 own subsidiaries and deliveries to over 200 countries, the company also supports its customers with application consulting, training, calibration and maintenance. The company's own DAkkS-accredited calibration laboratory in Germany tests and certifies calibration standards for customers worldwide.
- Site
- Sindelfingen
- Processes
- X-ray fluorescence analysis (XRF) – energy-dispersive X-ray fluorescence, Coating thickness measurement, Material analysis, Material testing (ferrite content, electrical conductivity), Magnetic-inductive measurement method, Amplitude-sensitive eddy-current measurement method, Phase-sensitive eddy-current measurement method, Duplex coating thickness measurement
- Materials
- Zinc (Zn) coating, Zinc-nickel (Zn-Ni) coating, Stainless steel, Duplex steel, Austenitic steel, Aluminum alloys, Gold, Copper alloys
- Certificates
- ISO 9001:2015, ISO/IEC 17025:2018, ISO/IEC 17025:2017, ISO/IEC 17025 (DAkkS calibration laboratory), ISO/IEC 17025 (further accredited laboratories internationally), DIN membership
- Founded
- 1953
- Employees
- 800
- Industries
- Electronics, Semiconductors, Electroplating, Automotive, Precious metals/Jewelry, Paints and coatings
- 01
Research and development
- 02
Instrument manufacturing
- 03
Application consulting and sample analysis
- 04
Sales and onsite consulting
- 05
Customer service, calibration, maintenance and repair
Measurement Methods and Analyses
X-ray fluorescence analysis (energy-dispersive)
Non-destructive coating thickness measurement and elemental analysis of metal alloys, precious metal alloys and plating solutions.
X-ray fluorescence microanalysis
High-precision analysis of the thinnest coatings, complex geometries and multilayer systems, e.g. on wafers and printed circuit boards.
Magnetic-inductive measurement method
Coating thickness measurement of non-magnetic coatings on ferromagnetic base materials.
Eddy-current method (amplitude- and phase-sensitive)
Coating thickness measurement of non-conductive coatings on non-ferrous metals as well as duplex measurement.
Coulometric measurement method
Galvanic stripping for coating thickness determination across multiple layers.
Ferrite content measurement
Rapid testing of weld seams and austenitic or duplex steels.
Electrical conductivity measurement
Sorting of aluminum alloys, heat treatment verification and authenticity testing of gold bars and coins.
Beta backscatter measurement method
Coating thickness measurement, e.g. on printed circuit boards.
Terahertz measurement
Measurement method for non-conductive coatings and applications that do not require X-ray radiation.
Locations
Sindelfingen
DEHeadquarters, development, manufacturing, DAkkS calibration laboratory
- X-ray fluorescence instruments (XRF)
- Tactile instruments
- Automated measuring systems
- Polycapillary X-ray optics
Industries
Processes & technical limits
| Processes | Tolerance | Max. part | Weight | Lot size | Materials |
|---|---|---|---|---|---|
| X-ray fluorescence analysis (XRF) – energy-dispersive X-ray fluorescenceTesting | – | – | – | – | Metal alloys, Precious metal alloys, plating solutions |
| Coating thickness measurementTesting | – | – | – | – | – |
| Material analysisTesting | – | – | – | – | – |
| Material testing (ferrite content, electrical conductivity)Testing | – | – | – | – | austenitic steels, duplex steels, Non-ferrous metals, gold |
| Magnetic-inductive measurement methodTesting | – | – | – | – | – |
| Amplitude-sensitive eddy-current measurement methodTesting | – | – | – | – | – |
| Phase-sensitive eddy-current measurement methodTesting | – | – | – | – | – |
| Duplex coating thickness measurementTesting | – | – | – | – | – |
| Magnetic measurement methodTesting | – | – | – | – | – |
| Micro-resistivity measurement methodTesting | – | – | – | – | – |
| Beta backscatter measurement methodTesting | – | – | – | – | – |
| Coulometric measurement methodTesting | – | – | – | – | – |
| Terahertz measurementTesting | – | – | – | – | – |
| Ferrite content measurementTesting | – | – | – | – | austenitic claddings, duplex steels, stainless steel weld seams |
| Electrical conductivity measurementTesting | – | – | – | – | aluminum alloys, gold |
| Gold/precious metal analysis (authenticity and value determination)Testing | – | – | – | – | gold, precious metals, dental alloys |
| Calibration and certification of standards (DAkkS calibration laboratory)Testing | – | – | – | – | – |
| Bath/solution analysis (electroplating baths via XRF)Testing | – | – | – | – | metal plating solutions |
| Trace analysis & RoHS screeningTesting | – | – | – | – | – |
34 Anlagen & Maschinen
| Machine | Manufacturer / model | Quantity | Working area | Year built | Site |
|---|---|---|---|---|---|
| X-ray fluorescence instrument (XRF benchtop) | Helmut Fischer FISCHERSCOPE X-RAY XULM/XUL | – | – | – | – |
| X-ray fluorescence instrument (XRF benchtop) | Helmut Fischer FISCHERSCOPE X-RAY XAN | – | – | – | – |
| Gold testing instrument (XRF) | Helmut Fischer GOLDSCOPE SD | – | – | – | – |
| Gold testing instrument (XRF) | Helmut Fischer GOLDSCOPE SD 600 | – | – | – | – |
| X-ray fluorescence instrument (XRF) | Helmut Fischer FISCHERSCOPE X-RAY XDAL 600 | – | – | – | – |
| X-ray fluorescence instrument (XRF) | Helmut Fischer FISCHERSCOPE X-RAY XDL | – | – | – | – |
| X-ray fluorescence instrument (XRF) | Helmut Fischer FISCHERSCOPE X-RAY XDLM | – | – | – | – |
| X-ray fluorescence instrument (XRF) | Helmut Fischer FISCHERSCOPE X-RAY XDAL | – | – | – | – |
| X-ray fluorescence instrument (XRF, SDD detector) | Helmut Fischer FISCHERSCOPE X-RAY XDV-SDD | – | – | – | – |
| X-ray fluorescence microanalysis (µ-XRF) | Helmut Fischer FISCHERSCOPE X-RAY XDV-µ | – | – | – | – |
| X-ray fluorescence microanalysis | Helmut Fischer FISCHERSCOPE X-RAY XDV-µ LD | – | – | – | – |
| X-ray fluorescence instrument for wafers | Helmut Fischer FISCHERSCOPE X-RAY XDV-µ WAFER | – | – | – | – |
| X-ray fluorescence instrument for printed circuit boards (PCB) | Helmut Fischer FISCHERSCOPE X-RAY XDLM-PCB | – | – | – | – |
| X-ray fluorescence instrument for printed circuit boards (PCB) | Helmut Fischer FISCHERSCOPE X-RAY XDAL-PCB | – | – | – | – |
| X-ray fluorescence instrument for printed circuit boards (PCB) | Helmut Fischer FISCHERSCOPE X-RAY XDV-µ PCB | – | – | – | – |
| X-ray fluorescence instrument for large-format printed circuit boards (high-throughput QC) | Helmut Fischer FISCHERSCOPE XDV-µ PCB XL | – | largest measurement range (according to manufacturer) | – | – |
| X-ray fluorescence instrument | Helmut Fischer FISCHERSCOPE X-RAY XAN 500 | – | – | – | – |
| Tactile instrument (conductivity/coating thickness measurement) | Helmut Fischer MP0 series | – | – | – | – |
| Tactile instrument | Helmut Fischer DMP10-40 series | – | – | – | – |
| Duplex coating thickness gauge | Helmut Fischer DUALSCOPE FMP100 / H FMP150 | – | – | – | – |
| Instrument for copper thickness on printed circuit boards | Helmut Fischer SR-SCOPE DMP30 | – | – | – | – |
| Phase-sensitive coating thickness gauge | Helmut Fischer PHASCOPE PMP10 / PMP10 DUPLEX | – | – | – | – |
| Coulometric instrument | Helmut Fischer COULOSCOPE CMS2 / CMS2 STEP | – | – | – | – |
| Micro-resistivity/multi-point measurement system | Helmut Fischer FISCHERSCOPE MMS PC2 | – | – | – | – |
| Beta backscatter instrument | Helmut Fischer BETASCOPE | – | – | – | – |
| Conductivity meter | Helmut Fischer SIGMASCOPE SMP350 | – | – | – | – |
| Conductivity meter for gold bars/coins | Helmut Fischer SIGMASCOPE GOLD B / GOLD C | – | – | – | – |
| Ferrite content meter | Helmut Fischer FERITSCOPE DMP30 | – | – | – | – |
| Automated XRF measuring system | Helmut Fischer FISCHERSCOPE X-RAY 5000 series | – | – | – | – |
| Automated XRF measuring system | Helmut Fischer FISCHERSCOPE X-RAY 4000 series | – | – | – | – |
| Automated µ-XRF system for semiconductors | Helmut Fischer FISCHERSCOPE X-RAY XDV-µ SEMI | – | – | – | – |
| XRF solution analyzer for electroplating baths | Helmut Fischer FISCHERSCOPE XAN LIQUID ANALYZER | – | – | – | – |
| Automated material testing system | Helmut Fischer FISCHERSCOPE MMS Automation | – | – | – | – |
| Polycapillary X-ray optic (OEM) | Helmut Fischer Polycapillary optics | – | – | – | – |
Additional services
Reference customers
Quality and Accreditation
The company is certified to ISO 9001:2015 and operates a DAkkS-accredited calibration laboratory in Germany as well as additional laboratories accredited to ISO/IEC 17025 in the USA, Switzerland, China and Mexico. As a DIN member, it participates in German standardization.
| Evidence | Sindelfingen |
|---|---|
| ISO 9001:2015 | |
| ISO/IEC 17025 (DAkkS calibration laboratory) | |
| ISO/IEC 17025 (further accredited laboratories internationally) | |
| DIN membership |
Company History
- 1953
Founded by Helmut Fischer.