
Brokerage of surface analysis methods (IGC, ToF-SIMS, XPS, SEM) for product development

Inolytix AG
Bahnhofstrasse 35, 4334 Sisseln, SwitzerlandNew on Amplifa
About Inolytix
Inolytix AG is a Swiss service company based in Sisseln (canton of Aargau) specialising in brokering and consulting on analysis methods for physico-chemical surface analysis. The company supports R&D departments, particularly in the chemical and specialty chemicals industries, in selecting the measurement method best suited to their problem and routes tasks to a network of experienced partner analysis laboratories in Germany and Switzerland. The offering covers methods such as inverse gas chromatography (IGC), ToF-SIMS, XPS, micro/nano tomography, scanning electron microscopy (SEM) and the quartz crystal microbalance (QCM). Inolytix handles the complete process – from consulting and a free 30-minute initial consultation through quotation and sample shipping to the detailed report and invoicing. Founder and managing director Dr. Ralf Dümpelmann has 20 years of experience in senior R&D roles in the specialty chemicals industry.
- Site
- Sisseln, Switzerland
- Processes
- IGC (Inverse Gas Chromatography), ToF SIMS, XPS, Micro/Nano Tomography, SEM, QCM, Brokering of analysis methods for physico-chemical surface analysis (IGC, ToF-SIMS, XPS,, Consulting on selecting the appropriate analysis method
- Materials
- Inverse Gas Chromatography, Time-of-Flight Secondary Ion Mass Spectrometry, X-ray Photoelectron Spectroscopy, Micro/Nano Tomography, Scanning Electron Microscopy, Quartz Crystal Microbalance
- Industries
- Chemical industry / Specialty chemicals, R&D departments
- 01
Initial consultation and analysis of the problem
- 02
Selection of the appropriate analysis method
- 03
Referral to a partner laboratory in Germany or Switzerland
- 04
Cost clarification and quotation
- 05
Sample shipping
- 06
Performance of the analysis
- 07
Detailed report
- 08
Invoicing
Analysis Methods
Inverse Gas Chromatography
Physico-chemical characterisation of surfaces and interfaces.
Time-of-Flight Secondary Ion Mass Spectrometry
Chemical surface analysis with high sensitivity.
X-ray Photoelectron Spectroscopy
Determination of the chemical composition of the topmost surface layers.
Micro/Nano Tomography
Three-dimensional imaging of sample structures at the micro and nano scale.
Scanning Electron Microscopy
High-resolution imaging of surfaces and structures.
Quartz Crystal Microbalance
Measurement of mass changes and interactions at surfaces.
Locations

Sisseln
CHHeadquarters with consulting and brokering of analysis services
Industries
Processes & technical limits
| Processes | Tolerance | Max. part | Weight | Lot size | Materials |
|---|---|---|---|---|---|
| IGC (Inverse Gas Chromatography)Testing | – | – | – | – | – |
| ToF SIMSTesting | – | – | – | – | – |
| XPSTesting | – | – | – | – | – |
| Micro/Nano TomographyTesting | – | – | – | – | – |
| SEMTesting | – | – | – | – | – |
| QCMTesting | – | – | – | – | – |
1 Anlagen & Maschinen
| Machine | Manufacturer / model | Quantity | Working area | Year built | Site |
|---|---|---|---|---|---|
| IGC measuring instrument | Adscientis | – | – | – | – |
Additional services