AI tools and engineering services for semiconductor test, from Design for Test to yield management in volume.
SilTest Semiconductors GmbH
Kleve (DE) · Doha (QA) · Bangalore (IN)New on Amplifa
About SilTest
SilTest Semiconductors GmbH is an engineering company headquartered in Kleve specializing in semiconductor test. The company develops and licenses AI tools such as VISTAR, YieldOptiX, STDF Quick Viewer, DefectOptiX and CertOptiX, which reduce manual effort in chip test and production – from test program generation through data analysis to outgoing-quality modeling. In addition, SilTest offers engineering services along the entire product flow: Design for Test (Scan, BIST, Boundary Scan, ATPG), hardware design for load boards and probe cards, test engineering from NPI to series production, Packaging and Qualification as well as yield management with failure analysis. The engineers work across platforms on common ATE testers from Advantest, Teradyne, NI and Chroma for wafer-level, final and system-level test. Applications are found in automotive (ADAS, power), data center, AI accelerators, photonics, as well as defense and aerospace. The company was incubated at the Qatar Science and Technology Park and operates three engineering hubs in Kleve, Doha and Bangalore.
- Site
- Kleve
- Processes
- Design for Test (Scan, BIST, Boundary Scan, ATPG), ATE Test Program Development / Test Engineering (wafer, final, system-level test), Hardware Design (Load Boards, Probe Cards, HTOL/Burn-in Boards), Packaging and Qualification (Qualification, Characterization, Reliability Testing), Yield Management (Failure Analysis, Drift Analysis, Gage R&R, ATE-to-Bench Correlation), AI Test Data Analysis (VISTAR, YieldOptiX, DefectOptiX, STDF Quick Viewer, CertOptiX), Hardware Design (Load Boards, Probe Cards, Substrate Design, SI/PI), Test Engineering (NPI, Debug, Characterization, ATE Test Program Development)
- Materials
- Design for Test (Scan, BIST, Boundary Scan, ATPG), ATE Test Program Development (Wafer, Final, System-Level), Hardware Design (Load Boards, Probe Cards, Substrate Design), Packaging and Qualification, Yield Management
- Industries
- Semiconductors, Automotive (ADAS, Power), Data Center and Networking, AI/Accelerators, Photonics, Defense and Aerospace
- 01
Design for Test
- 02
Hardware Design (Load Boards, Probe Cards)
- 03
Test Engineering (NPI, Debug, ATE Programming)
- 04
Packaging and Qualification
- 05
Yield Management and Sustaining
Services and Platforms
Design for Test (Scan, BIST, Boundary Scan, ATPG)
Test structure insertion from RTL to tapeout for high fault coverage with fewer patterns.
ATE Test Program Development (Wafer, Final, System-Level)
NPI, debug and characterization on Advantest, Teradyne, NI and Chroma testers.
Hardware Design (Load Boards, Probe Cards, Substrate Design)
Boards for wafer and final test as well as HTOL/burn-in, including SI/PI simulation up to 56 GBps SerDes.
Packaging and Qualification
MPW/SPW assembly, reliability testing, characterization and release to production including a PPAP path.
Yield Management
Failure analysis, drift analysis, Gage R&R and ATE-to-bench correlation with AI-supported data analysis.
Locations
Kleve
DEHeadquarters, Engineering, SilTest Academy
- Advantest V93000
- Advantest T2000
- Teradyne UltraFLEXplus
- Teradyne J750
- Teradyne ETS-800
- Teradyne ETS-88
- LTX Chroma
- NI ATE
Doha
QAEngineering and regional operations, Qatar Science and Technology Park
Bangalore
INEngineering
Service Profiles
Inside the production
Industries
Processes & technical limits
| Processes | Tolerance | Max. part | Weight | Lot size | Materials |
|---|---|---|---|---|---|
| Design for Test (Scan, BIST, Boundary Scan, ATPG)Testing | – | – | – | – | – |
| ATE Test Program Development / Test Engineering (wafer, final, system-level test)Testing | – | – | – | – | – |
| Hardware Design (Load Boards, Probe Cards, HTOL/Burn-in Boards)Engineering | – | – | – | – | – |
| Packaging and Qualification (Qualification, Characterization, Reliability Testing)Testing | – | – | – | – | – |
| Yield Management (Failure Analysis, Drift Analysis, Gage R&R, ATE-to-Bench Correlation)Testing | – | – | – | – | – |
| AI Test Data Analysis (VISTAR, YieldOptiX, DefectOptiX, STDF Quick Viewer, CertOptiX)Testing | – | – | – | – | – |
9 Anlagen & Maschinen
| Machine | Manufacturer / model | Quantity | Working area | Year built | Site |
|---|---|---|---|---|---|
| ATE Tester | Advantest V93000 (V93K) | – | – | – | – |
| ATE Tester | Advantest T2000 | – | – | – | – |
| ATE Tester | Teradyne UltraFLEXplus | – | – | – | – |
| ATE Tester | Teradyne J750 | – | – | – | – |
| ATE Tester | Teradyne ETS-800 | – | – | – | – |
| ATE Tester | Teradyne ETS-88 | – | – | – | – |
| ATE Tester | LTX Chroma | – | – | – | – |
| ATE Tester | NI | – | – | – | – |
| ATE Tester | Chroma | – | – | – | – |
Additional services
Reference customers
History
Incubated at the Qatar Science and Technology Park (QSTP), High-Tech Accelerator alumni
More than 30 supported product ramps