Development and manufacture of automatic test systems (ATE) for semiconductor ICs, MEMS, electronic boards and modules
SPEA S.p.A.
Volpiano (Turin) · Suzhou · Shenzhen · Chongqing · Fernwald (Steinbach, Frankfurt) · Tyler · Chandler (Arizona) · Santa ClaraNew on Amplifa
About SPEA
SPEA S.p.A., headquartered in Volpiano near Turin (Italy), has been developing and manufacturing automatic test systems (Automatic Test Equipment, ATE) for electronic components and assemblies since 1976. The product portfolio includes Flying Probe Testers, In-Circuit Testers, EOL functional testers, LED and battery testers, as well as test systems for mixed-signal semiconductors, power semiconductors (SiC/GaN), wafer probers, MEMS test cells and KGD test cells (including the H7000 model) for known-good-die testing of SiC and GaN dies directly on the diced wafer. The offering is complemented by AI-supported automatic defect detection (QSoft Leonardo OS) and boundary-scan testing combined with ICT for populated printed circuit boards. Customers come primarily from the semiconductor industry, automotive and aerospace engineering, as well as the energy and solar sectors. SPEA maintains manufacturing and administration in Volpiano as well as branch offices in China (Suzhou, Shenzhen, Chongqing), Germany (SPEA GmbH, Fernwald) and the USA (Tyler/Chandler) and is opening an Innovation Hub in Santa Clara.
- Site
- Volpiano (TO)
- Processes
- In-Circuit Testing (ICT), Flying Probe Testing, EOL Functional Testing, LED Light Testing, Battery Testing, Mixed Signal Semiconductor Testing, Power Semiconductor Testing, Wafer Probing and Testing
- Materials
- Flying Probe Testing, In-Circuit Testing (ICT), EOL Functional Testing, LED Light Testing, Battery Testing, Mixed Signal Testing, Power Semiconductor Testing, Wafer Probing and Testing
- Certificates
- Integrated QHSE management system
- Founded
- 1976
- Industries
- Semiconductors, Automotive, Aerospace & Defense, Energy & Solar, Electronics, Medical Technology
- 01
Engineering and design of the test systems
- 02
Manufacture of the ATE systems in Volpiano
- 03
Software development (QSoft Leonardo OS, AI defect detection)
- 04
Integration and testing
- 05
Sales and service via worldwide branch offices
Test Technologies and Processes
Flying Probe Testing
Flexible contacting of electronic boards without adapters, also suitable for small production volumes.
In-Circuit Testing (ICT)
Testing of populated printed circuit boards (PCBA) in high-volume production, also combined with Boundary Scan.
EOL Functional Testing
End-of-line functional testing of electronic assemblies and modules.
LED Light Testing
Testing of LED modules.
Battery Testing
Testing of EV and consumer batteries.
Mixed Signal Testing
Testing of mixed-signal semiconductor ICs.
Power Semiconductor Testing
Testing of power semiconductors as well as SiC and GaN dies.
Wafer Probing and Testing
Testing of semiconductor wafers.
MEMS Testing
Test cells and stimulus units for MEMS sensors.
KGD Testing (H7000)
Known-good-die testing including high-voltage testing of SiC and GaN dies directly on the diced wafer.
AI-supported defect detection (QSoft Leonardo OS)
Automatic defect detection through the combination of AI and automatic testing.
Smart Card Testing
Test cells and HF/UHF testers for smart cards.
Locations
Volpiano (Turin)
ITHeadquarters, administration and production
- Flying Probe Tester
- In-Circuit Tester
Fernwald (Steinbach, Frankfurt)
DEBranch office SPEA GmbH
Suzhou
CNBranch office
Shenzhen
CNBranch office
Chongqing
CNBranch office
Tyler
USBranch office SPEA America LLC
Chandler (Arizona)
USBranch office SPEA America LLC
Santa Clara
USInnovation Hub
Test Systems and Applications
Inside the production
Industries
Processes & technical limits
| Processes | Tolerance | Max. part | Weight | Lot size | Materials |
|---|---|---|---|---|---|
| In-Circuit Testing (ICT)Testing | – | – | – | – | PCBA |
| Flying Probe TestingTesting | – | – | – | – | Electronic boards |
| EOL Functional TestingTesting | – | – | – | – | Electronic assemblies |
| LED Light TestingTesting | – | – | – | – | LED modules |
| Battery TestingTesting | – | – | – | – | Batteries |
| Mixed Signal Semiconductor TestingTesting | – | – | – | – | Semiconductor ICs |
| Power Semiconductor TestingTesting | – | – | – | – | Power semiconductors, SiC dies, GaN dies |
| Wafer Probing and TestingTesting | – | – | – | – | Semiconductor wafers |
| MEMS TestingTesting | – | – | – | – | MEMS sensors |
| KGD (Known Good Die) TestingTesting | – | – | – | – | SiC dies, GaN dies, Semiconductor dies |
| Boundary Scan Testing (combined with ICT)Testing | – | – | – | – | PCBA |
| Smart Card TestingTesting | – | – | – | – | Smart cards |
| Automated Defect Detection with Artificial IntelligenceTesting | – | – | – | – | Electronic products |
| Design and manufacture of Automatic Test Equipment (ATE)Engineering | – | – | – | – | – |
10 Anlagen & Maschinen
| Machine | Manufacturer / model | Quantity | Working area | Year built | Site |
|---|---|---|---|---|---|
| Flying Probe Tester | SPEA | – | – | – | Volpiano (TO), Italy |
| In-Circuit Tester | SPEA | – | – | – | Volpiano (TO), Italy |
| EOL Functional Tester | SPEA | – | – | – | – |
| LED Light Tester | SPEA | – | – | – | – |
| Battery Tester | SPEA | – | – | – | – |
| Mixed Signal Tester | SPEA | – | – | – | – |
| Power Semiconductor Tester | SPEA | – | – | – | – |
| Wafer Prober & Tester | SPEA | – | – | – | – |
| MEMS Test Cell | SPEA | – | – | – | – |
| KGD Test Cell | SPEA H7000 | – | – | – | – |
Additional services
Quality
SPEA operates an integrated management system for quality, environment, occupational safety and ethics (QHSE Integrated Policy) and obligates suppliers through a Code of Conduct. The goal is the continuous improvement of product and process quality.
| Evidence | Volpiano (Turin) |
|---|---|
| Integrated QHSE management system |
History
- 1976
Founding of SPEA; since then development and manufacture of automatic test systems for electronics and semiconductors
- 2021
Establishment of an ESG committee to embed sustainable development
- 2026
Opening of the new Innovation Hub in Santa Clara (Silicon Valley)