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DR YIELD – Fertigung

Develops yield management and analytics software for the semiconductor industry in Graz.

DR YIELD Logo

DR YIELD software & solutions GmbH

Opernring 4, 8010 Graz, AustriaNew on Amplifa

2005Founded
20+Years of yield analytics
1,000+Users
3Software editions
FN 276459h, LG ZRS GrazCommercial register

About DR YIELD

DR YIELD is an Austrian software company based in Graz that has focused exclusively on yield and quality analytics in semiconductor manufacturing since 2005. The product YieldWatchDog integrates data from wafer sort, final test, PCM/WAT, defect and AOI inspection, equipment and MES into a unified, highly compressed data model and answers yield questions in seconds across years of data. The software offers modules for statistical process control, Part Average Testing (PAT), equipment monitoring, material traceability and AI-supported anomaly detection, including the YWD AIssistant. Customers include fabless companies, foundries, IDMs and OSATs in Europe, Asia and North America, among others in the Power/SiC, Automotive and Analog segments. Integration, installation, training and support are provided by the company's own team of developers and yield and test engineers, complemented by an international partner network.

Site
Graz
Processes
Yield management and analytics software (YieldWatchDog), Data integration (wafer sort, final test, PCM/WAT, defect/AOI, equipment, MES), Customer-specific data parsers/loaders (100+ file formats, e.g. STDF/ATDF, KLARF), Installation, on-site training and support, REST API integration, Trial installations, AI-supported anomaly detection and YWD AIssistant
Materials
YieldWatchDog Platform, Data Integration, Advanced Quality Module / PAT, YWD AIssistant & AI Anomaly Detection, Material Tracing Module
Certificates
Fully automated software testing
Founded
2005
Industries
Semiconductor industry, Fabless & Foundries, IDM & OSAT, Power/SiC, Automotive, Analog
  1. 01

    Data integration (parsers/loaders)

  2. 02

    Database import & compression

  3. 03

    Analysis & monitoring modules

  4. 04

    AI functions (anomaly detection, AIssistant)

  5. 05

    Installation, training & support

Software & Modules

YWD

YieldWatchDog Platform

Yield management and analytics platform with Professional, Industrial and Ultimate editions for different scales of operation.

DAT

Data Integration

Integration of wafer sort, final test, PCM/WAT, defect/AOI, equipment and MES data into a unified data model.

PAT

Advanced Quality Module / PAT

Outlier screening for automotive and other zero-defect industries, aligned with frameworks such as AEC-Q001.

AI

YWD AIssistant & AI Anomaly Detection

Pattern recognition, multivariate monitoring and an AI assistant, part of the platform since 2017.

TRC

Material Tracing Module

Lot, wafer and die genealogy along the entire supply chain from raw material to final test.

Locations

Standort Graz

Graz

AT

Headquarters, Development & Support

Materials
YieldWatchDog software
  • YieldWatchDog development
  • Data integration & parsers
  • Remote & on-site support

Modules & Functions

Multivariate Monitoring (T² Statistics)
Multivariate Monitoring (T² Statistics)Analytics · Semiconductor
SPC Trend with Control Limits
SPC Trend with Control LimitsStatistical Process Control · Semiconductor
YWD AIssistant
YWD AIssistantAI Assistant · Semiconductor
Automatic Wafer Pattern Recognition
Automatic Wafer Pattern RecognitionAI · Semiconductor
Equipment Report
Equipment ReportEquipment Monitoring · Semiconductor
Part Average Testing (PAT)
Part Average Testing (PAT)Quality · Automotive
Material Tracing (Trace Order)
Material Tracing (Trace Order)Traceability · Semiconductor
Defect Module Wafer Map
Defect Module Wafer MapDefect Analysis · Semiconductor

Inside the production

Defect Module with Wafer Map and Defect Filters
Defect Module with Wafer Map and Defect Filters

Industries

Semiconductor industryFabless & FoundriesIDM & OSATPower/SiCAutomotiveAnalogSemiconductor industry (fabless, foundries, IDM/OSAT)

Additional services

Yield management and analytics software (YieldWatchDog)Data integration (wafer sort, final test, PCM/WAT, defect/AOI, equipment, MES)Customer-specific data parsers/loaders (100+ file formats, e.g. STDF/ATDF, KLARF)Installation, on-site training and supportREST API integrationTrial installationsAI-supported anomaly detection and YWD AIssistant

Reference customers

Inova Semiconductors

Quality

Software quality is ensured by an integrated, fully automated testing system; support is provided directly by the development team in Graz.

EvidenceGraz
Fully automated software testing

History

  1. 1998

    The future founder developed scripts for automatic yield monitoring in a semiconductor fab; detected trends and prevented an excursion (approx. USD 1 million in savings)

  2. 2004

    Business plan and preparation for founding

  3. 2005

    Founding of DR YIELD by former yield and test engineers

  4. 2006

    First customer; first office at Opernring in Graz; product name YieldWatchDog

  5. 2013

    Customers and sales partners in all major semiconductor regions (first Japan, then Europe and North America)

  6. 2017

    AI functions integrated into the YieldWatchDog platform

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