Manufacturer of Automated Test Equipment for electronics as well as provider of robotics and test engineering services
Teradyne, Inc.
North Reading, MA (Headquarters) · Munich · Bracknell · Suresnes · Singapore · Shanghai · Tokyo/Yokohama · Seoul · Caesarea · AlajuelaNew on Amplifa
About Teradyne
Teradyne develops and manufactures automated test systems (ATE) for the electronics industry. The portfolio includes semiconductor test systems for logic, RF, analog, power, mixed-signal and memory technologies, system-level test solutions for AI and data-center devices, in-circuit and production test systems for printed circuit board assemblies (PCBA), memory and storage test solutions for HDD and SSD, wireless test systems for cellular and connectivity standards, as well as functional and field test systems for defense and aerospace applications; complemented by optical test systems for silicon photonics. The modular architectures scale from laboratory use to high-volume manufacturing. In the field of robotics, Teradyne offers collaborative robots (cobots), autonomous mobile robots (AMR) and hybrid mobile cobots for automating repetitive manual tasks. A global service and support network provides test program development, conversion services, engineering services, training, parts supply and lifecycle support. Customers include semiconductor manufacturers, electronics manufacturers as well as defense and aerospace companies worldwide. The corporation was founded in 1960, is listed on the NYSE and has its headquarters in North Reading, Massachusetts; in the German-speaking region the business is managed from Munich.
- Site
- North Reading, MA
- Processes
- Semiconductor Test (logic, RF, analog, power, mixed-signal, memory), Wireless Test (cellular and connectivity standards, high-volume manufacturing), Production Board Test (inspection and device programming of printed circuit board assemblies), Storage Test (HDD and SSD testing), Defense & Aerospace System-Level Test (military and avionics programs), Optical Test / Silicon Photonics Test, System Level Test (validation under thermal and electrical load), Vectorless Test Technologies: Framescan (Analog Framescan, Powered Framescan, Framescan FX)
- Materials
- Automated Test Equipment, Semiconductor Test, System-Level Test, Production Board Test, Memory Test, Wireless Test, Storage Test, Defense & Aerospace Test
- Founded
- 1960
- Industries
- Semiconductors, Electronics Manufacturing, Defense & Aerospace, Automotive, Consumer Electronics, Healthcare
- 01
Test system development (ATE hardware)
- 02
Software development (TestStudio, TPS Converter Studio)
- 03
Test program development and conversion services
- 04
System integration and deployment
- 05
Support, training and lifecycle management
Processes and Technologies
Automated Test Equipment
Test systems for semiconductors, printed circuit boards, storage, wireless and defense/aerospace.
Semiconductor Test
Testing of logic, RF, analog, power, mixed-signal and memory technologies.
System-Level Test
Validation of devices under thermal and electrical load, among others for AI and data-center applications.
Production Board Test
Inspection and device programming of printed circuit board assemblies (PCBA).
Memory Test
Test systems for memory devices (Magnum family).
Wireless Test
High-volume testing of cellular and connectivity standards.
Storage Test
Automated testing of HDD and SSD devices.
Defense & Aerospace Test
System-level and functional testing for military and avionics programs with lifecycle support.
Optical Test
Test systems for silicon photonics.
Robotic Task Automation
Cobots, AMRs and hybrid mobile cobots for automation tasks.
Engineering Services
Turnkey and custom test program development, conversion and optimization.
Locations
North Reading, MA
USCorporate Headquarters
- UltraFLEXplus
- UltraFLEX
- J750Ex-HD
- Titan HP
- TestStation
Munich
DEGerman business operations
Bracknell
GBTeradyne Ltd. (Europe)
Suresnes
FRTeradyne SAS
Singapore
SGTeradyne (Asia) Pte. Ltd.
Shanghai
CNTeradyne (Shanghai) Co. LTD
Tokyo/Yokohama
JPTeradyne K.K.
Seoul
KRTeradyne Korea LTD
Caesarea
ILLitePoint Europe A.S.
Alajuela
CRTeradyne of Costa Rica S.A.
Industries
Processes & technical limits
| Processes | Tolerance | Max. part | Weight | Lot size | Materials |
|---|---|---|---|---|---|
| Semiconductor Test (logic, RF, analog, power, mixed-signal, memory)Testing | – | – | – | – | – |
| Wireless Test (cellular and connectivity standards, high-volume manufacturing)Testing | – | – | – | – | – |
| Production Board Test (inspection and device programming of printed circuit board assemblies)Testing | – | – | – | – | – |
| Storage Test (HDD and SSD testing)Testing | – | – | – | – | – |
| Defense & Aerospace System-Level Test (military and avionics programs)Testing | – | – | – | – | – |
| Optical Test / Silicon Photonics TestTesting | – | – | – | – | – |
| System Level Test (validation under thermal and electrical load)Testing | – | – | – | – | – |
| Vectorless Test Technologies: Framescan (Analog Framescan, Powered Framescan, Framescan FX)Testing | – | – | – | – | Printed circuit board assemblies (PCBA) |
| Boundary Scan TestTesting | – | – | – | – | – |
| Automated Thermal TestTesting | – | – | – | – | – |
| Robotic Task Automation (Cobots, AMRs, hybrid mobile cobots)Assembly | – | – | – | – | – |
| Test Program Development & Conversion Services (platform-to-platform, design-to-test, WaveWizardEngineering | – | – | – | – | – |
26 Anlagen & Maschinen
| Machine | Manufacturer / model | Quantity | Working area | Year built | Site |
|---|---|---|---|---|---|
| Semiconductor Test System (SoC/Digital/Mixed-Signal) | Teradyne UltraFLEXplus | – | – | – | – |
| Semiconductor Test System | Teradyne UltraFLEX | – | – | – | – |
| Semiconductor Test System | Teradyne J750Ex-HD Platform | – | – | – | – |
| Semiconductor Test System | Teradyne IP750Ex-HD | – | – | – | – |
| Analog/Power Test System | Teradyne ETS-364 | – | – | – | – |
| Analog/Power Test System | Teradyne ETS-800 | – | – | – | – |
| Analog/Power Test System | Teradyne ETS-88 | – | – | – | – |
| Memory Test System | Teradyne Magnum E2 | – | – | – | – |
| Memory Test System | Teradyne Magnum EPIC | – | – | – | – |
| Memory Test System | Teradyne Magnum V | – | – | – | – |
| Memory Test System | Teradyne Magnum VUy | – | – | – | – |
| Memory Test System | Teradyne Magnum 7 | – | – | – | – |
| Memory Test System | Teradyne Magnum 7H | – | – | – | – |
| System-Level Test System | Teradyne Titan HP | – | – | – | – |
| System-Level Test System | Teradyne Titan | – | – | – | – |
| Storage Test System | Teradyne Saturn | – | – | – | – |
| In-Circuit Test System (Production Board Test) | Teradyne TestStation Product Family | – | – | – | – |
| Production Board Test System | Teradyne Omnyx | – | – | – | – |
| Functional Test System (Defense & Aerospace) | Teradyne Spectrum-9100 | – | – | – | – |
| Functional Test System (Defense & Aerospace, Board Test) | Teradyne Spectrum BT | – | – | – | – |
| Field Test System | Teradyne Guardian | – | – | – | – |
| Automated Thermal Test System | Teradyne Tempo | – | – | – | – |
| Optical Test System | Teradyne Iris 100 | – | – | – | – |
| Optical Test System | Teradyne Photon 100 | – | – | – | – |
| Collaborative Robot (Cobot) | Universal Robots (Teradyne) | – | – | – | – |
| Autonomous Mobile Robot (AMR) | Teradyne (MiR) | – | – | – | – |
Additional services
Reference customers
History
- 1960
Founded by Alex d'Arbeloff and Nick DeWolf in Boston
- 1961
First product (diode tester) sold to Raytheon
- 1980er
Acquisition of Zehntel (in-circuit board test)
- 1987
Introduction of the first analog VLSI test system A500
- 1990er
Acquisition of Megatest; market leadership in SoC test (Catalyst, Tiger)
- 2000/2001
Acquisition of GenRad, integration into Assembly Test Division
- 2006
Consolidation of the Boston site to North Reading, MA
- 2008
Acquisitions of Nextest and Eagle Test Systems; market entry into disk-drive test (Neptune)
- 2011
Acquisition of LitePoint (wireless test)
- 2014
Mark Jagiela becomes CEO
- 2015
Acquisition of Universal Robots (Denmark)